Decompressed scan chain masking circuit shift register with log2(n/n) cells

ABSTRACT

Electronic scan circuitry includes a decompressor ( 510 ), a plurality of scan chains ( 520   .i ) fed by the decompressor ( 510 ), a scan circuit ( 502, 504 ) coupled to the plurality of scan chains ( 520   .i ) to scan them in and out, a masking circuit ( 590 ) fed by the scan chains ( 520   .i ), and a scannable masking qualification circuit ( 550, 560, 580 ) coupled to the masking circuit ( 590 ), the masking qualification circuit ( 550, 560, 580 ) scannable by scan-in of bits by the decompressor ( 510 ) along with scan-in of the scan chains ( 520   .i ), and the scannable masking qualification circuit ( 550, 560, 580 ) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit ( 590 ). Other scan circuitry, processes, circuits, devices and systems are also disclosed.

CROSS-REFERENCES TO RELATED APPLICATIONS

This application is a divisional of U.S. application Ser. No.14/487,538, filed on Sep. 16, 2014, now U.S. Pat. No. 9,091,729, grantedJul. 28, 2015.

Which was a divisional of application Ser. No. 12/904,303, filed Oct.14, 2010, now U.S. Pat. No. 8,887,018, granted Nov. 11, 2014;

And is related to India Patent Application 1625/CHE/2010 “CompressedScan Chain Diagnosis by Internal Chain Observation Processes, Circuits,Devices and Systems” filed Jun. 11, 2010, for which priority is claimedunder the Paris Convention and 35 U.S.C. 119 and all other applicablelaw, and which is incorporated herein by reference in its entirety.

FIELD OF THE INVENTION

The field of the invention includes design-for-test circuits inintegrated circuits, and processes of making and testing integratedcircuits.

BACKGROUND

In the integrated circuit field, scan testing involves introducingsequences of ones and zeros, called scan bits, into the integratedcircuits for testing them. Scan compression is a way of reducing thevolume of such bits sent from the tester to an integrated circuit.

Scan compression is mainstream technology today. A Glossary is providedin TABLE 1.

For some other background, see U.S. Pat. Nos. 7,657,790 and 7,743,302,and U.S. Published Patent Applications 20090228749 and 20050060625.

Hitherto, scan compression architectures have had three components:

-   1. Decompressor: Decompresses input channel data into internal    scan-ins. (A respective scan channel pertains to any given set of    scan chains among a number of such sets that make up all the scan    chains in the integrated circuit.) Different decompressor    architectures are available in the industry, e.g. XOR decompressor,    mux/demux decompressor, LFSR (Linear Feedback Shift Register) based    decompressor.-   2. Compactor/Compressor: Compresses internal scan-outs data into    output channels. Different compressor architectures are available in    the industry for e.g. XOR compressor, and MISR (Multiple Input    Signature Register) based compressor. These conventional compressors    are susceptible to unknowns (Xs) in the circuit. For example, an    unknown X in one internal STUMP can corrupt a whole signature in an    MISR based compressor. An unknown X can cause masking of multiple    internal scan chains (STUMPS) in an Xor (exclusive-OR) based    compressor. So the presence of Xs can cause substantial test    coverage loss.-   3. X-tolerance Logic: X-tolerance is a DFT technique to provide    immunity to compressor from unknowns (Xs) in the functional circuit    under test (DUT). Logic is provided to block the internal scan chain    having such unknowns (Xs), such as by including an AND gate per    internal scan chain. A second part is control logic that generates    blocking controls for the AND gates. Control logic programmation can    be done through ATPG (if control logic is getting input data from    decompressor or from top level input channels) or through external    interface like IEEE 1500 scan interface of FIG. 8, etc.

X-tolerance techniques that overcome current industry architecturelimitations and provide better compression and debug capabilities areneeded and would be most desirable. For instance, suppose anarchitecture always bypasses the compactor if one or more chains arehaving Xs, to prevent merging of multiple scan chains in the compactor,and hence prevent corruption of the compacted result by Xs. However,this results in significant loss of compression since the compactor isbypassed. in presence of Xs.

Compressed scan chains hitherto have been difficult to use to do debugand result in generation of bypass patterns to isolate the flip-flopthat is failing. In some cases a tool can generate patterns whereinternal scan chains are observed but this means regeneration ofpatterns and does neither mean that the same data will be observed, norguarantee same paths will be excited, and has other problems.

While test data compression is useful to reduce test data volume andtest application time, the reduced observability (due to output responsecompaction) results in two new issues:

(a) Tasks of debug and diagnostics, wherein the cause of one or morefailing outputs in one or more cycles must be diagnosed to one or a setof flip-flops in the design (which in turn drive these outputs), arerendered more difficult. Difficulty arises since (i) the faultlocalization to the set of failing flip-flops must now be performed withless volume of output data, i.e. reduced observability, and (ii) a givenfault may be exercised fewer times as the input decompressor drives fewprimary scan inputs into a larger number of internal scan inputs,thereby impairing the ability to excite a fault multiple times.

(b) Distinguishing groups of internal scan chains for the purpose oftest coverage improvement is rendered more difficult since per cycleindividual scan chain observability is no longer possible, on account ofmultiple internal scan chain outputs being grouped together into fewerprimary scan outputs through the output compactor logic.

The issues in (a) and (b) are addressed traditionally by switching thecircuit operation from scan compression mode to a prior type of a scanbypass mode. The latter has inherent disadvantages of (i) requiring alarger number of test cycles and (ii) of introducing a different stateof the circuit as compared to that which actually caused a pattern tofail.

In view of the above problems, it would be desirable to somehow providesolutions in this field that can address the problems and be economicalin terms of chip real estate, test time and test complexity.

SUMMARY OF THE INVENTION

Generally, and in one form of the invention, electronic scan circuitryincludes a decompressor, a plurality of scan chains fed by thedecompressor, a scan circuit coupled to the plurality of scan chains toscan them in and out, a masking circuit fed by the scan chains, and ascannable masking qualification circuit coupled to the masking circuit,the masking qualification circuit scannable by scan-in of bits by thedecompressor along with scan-in of the scan chains, and the scannablemasking qualification circuit operable to hold such scanned-in bits uponscan-out of the scan chains through the masking circuit.

Generally, and in another form of the invention, electronic scancircuitry includes a decompressor, a plurality of scan chains fed by thedecompressor, a masking logic fed by the plurality of scan chains, thescan chains scannable to scan them out in scan out cycles through themasking logic, and a scannable masking qualification circuit coupled tothe masking logic and operable both to select at least one of theplurality of scan chains for disqualification and to execute thedisqualification on a selected scan out cycle.

Generally, one electronic scan control process form of the inventionincludes scanning data into scan chains of a functional integratedcircuit via a decompression process, scan programming at least one maskqualification shift register via the decompression process, and maskingthe scan chains of the functional integrated circuit in response to thescan programming in the at least one mask qualification shift register,and holding such scan programming during scan-out of the scan chainsthus masked.

Generally, and in a further form of the invention, an integrated circuitchip includes a functional circuit having scan chains, a decompressorhaving an input for compressed data and a decompressor output coupled tofeed the scan chains, a compactor fed by the scan chains to provide acompactor output, and a selector circuit having inputs fed by the scanchains and an input for the compactor output, the selector circuitoperable to couple the compactor output to a selector circuit output,the selector circuit also operable to instead couple a selected set ofthe scan chains to the selector circuit output, and wherein the selectorcircuit has a programmable register binary-decoded for select-control ofthe selector circuit to select such set of scan chains.

Generally, another electronic scan control process form of the inventionincludes decompressing input compressed data to feed scan chains,compacting at least some of the scan chains to provide a compactoroutput, and binary-decoding a programmable register to select a givenset of scan chains for output, or selecting the compactor outputinstead.

Generally, a manufacturing process form of the invention associated witha design database and an original compressed pattern set earlierprovided for debug of the design database, involves a process including:fabricating an actual unit of the integrated circuit based on the designdatabase, and using the original compressed pattern set also as basisfor production scan test of the fabricated actual unit of the integratedcircuit.

Other scan circuitry, processes, circuits, devices and systems are alsodisclosed and claimed.

BRIEF DESCRIPTION OF THE DRAWINGS

FIGS. 1 and 2 are each a block diagram of an inventive scan chaincircuit performing respective operations.

FIG. 3 is a block diagram of another inventive scan chain circuit.

FIG. 4 is a block diagram of an inventively improved tester havinginventive software called Debug_pattern.pl, the tester coupled to any ofthe circuits and systems of the other Figures.

FIG. 5 is a block diagram of another inventive scan chain circuit calledX-Tol Arch-1 here.

FIG. 5A is a partially-block, partially-schematic diagram of aninventive masking circuit for use in FIGS. 5 and 7.

FIG. 5B is a partially-block, partially-schematic diagram of aninventive control circuit called an Xtol generator here, for use inFIGS. 5, 6, and 7.

FIG. 6 a block diagram of another inventive scan chain circuit calledX-Tol Arch-2 here.

FIG. 6A is a partially-block, partially-schematic diagram of a secondform of inventive masking circuit, this circuit for use in FIG. 6.

FIG. 7 is a block diagram of another inventive scan chain circuit calledX-Tol Arch-3 here.

FIG. 8 is a block diagram of another inventive scan chain circuitimproved as shown in the other Figures and coupled with a scaninterface.

FIG. 9 is a block diagram of an inventive system for multimediaprocessing and telecommunications improved as shown in the otherFigures.

FIG. 10 is a flow diagram of an inventive manufacturing productionprocess making or employing structures as shown in the other Figures.

FIG. 11 is a flow diagram of an inventive test process, for productionand otherwise, employing structures as shown in the other Figures, andwhich may also be used as an example of a sub-process in the process ofFIG. 10 and in the structure and process of FIG. 4.

Corresponding numerals in different Figures indicate corresponding partsexcept where the context indicates otherwise. A minor variation incapitalization or punctuation for the same thing does not necessarilyindicate a different thing. A suffix .i or .j refers to any of severalnumerically suffixed elements having the same prefix.

DETAILED DESCRIPTION OF EMBODIMENTS

The inventive embodiments described hereinbelow address and solve theabove-mentioned problems discussed in the Background, as well as otherproblems. They provide selective observability under user control ofinternal serial channels provided into a functional integrated circuitand that are scan chains called STUMPS. Such selective observabilitypromotes ease of diagnostics as well as fault coverage recovery withreduced test time by including the output compactor for observing theselected set of internal scan chains, e.g. without, in some of theembodiments, resorting to a bypass mode bypassing the compactor.

This way, selection of a subset of set of scan chains, which areamenable for compaction (and disabling others that have a significant Xcontent that in turn prevents meaningful compaction), is desirablyenabled.

Embodiments of structure and process keep the original pattern set thatwas developed. By changing the setup/header content of the patternset/tdl, each and every individual chain is separately observable.Various embodiments introduce control over observation of the internalscan chains through IR/DR of JTAG or P1500 and programmability of thechain/channel to observe, and bring out each chain for any given patterneasily. A Glossary is provided in TABLE 1.

Advantages include: The scan pattern set need not be regenerated—samepatterns and only modifications in tester description language (asagainst modifications in patterns—and hence regeneration—themselves)delivered to product engineering can be used for debug, without need ofcreating bypass patterns (bypassing scan compression logic inside theDUT). Individual chains are easily observed. The same pattern set can beused and individual chains can be observed for the same pattern, so thepaths/faults excited by the tool will remain the same. Any need togenerate a Bypass pattern (bypass of scan compression logic inside theDUT) is avoided. Effort would otherwise be needed to generate thesebypass patterns, verifying them and delivering them from the tester tothe chip under test, and such effort is avoided herein. Verification ofsuch bypass patterns takes a lot of simulation time for bigger designsas well.

New observability mechanisms for improved diagnostics and reduced testtime with scan compression are provided.

Among other benefits, some embodiments improve upon earlier techniquesin some or all the following ways, among others:

(a) Diagnostics of failing patterns can be carried out by translating aset of compressed ATPG patterns into an equivalent set of uncompactedpatterns through pattern post-processing alone. A modified orconstrained set of patterns is re-applied to the DUT through userprogramming of the JTAG/1500 test mode interface. There is no need toread these patterns into the ATPG tool again. Also, there is no need togenerate additional patterns.(b) Segregation or isolation of a specific set of internal scan chainscorresponding to specific pattern sets is achieved by retaining theoutput compactor. This therefore retains the benefits of compression andhence reduces test time while still achieving the same coverage in spiteof the need for segregation. Consider several motivating examples. Theseexamples include the need to isolate a set of scan chains which have alarge number of failing flip-flops due to gross process technologyissues, (e.g. memory wrapper scan flip-flop issues in memories, etc.),or due to gross timing issues which result in the flip-flops capturingan unknown value, or having their shift values disturbed, (e.g. due totiming violations in the DUT's scan mode of operation). Segregation ofinternal scan chains having such flip-flops is necessary for efficienttest pattern generation, since in its absence, such scan chains (withflip-flops having Xs instead of determinate values) will interfere(mask) the observability attainable through other scan chains withflip-flops capturing only determinate values.(c) If the number of such scan chains required to be isolated is large,the same observability mechanisms can be configured instead to select aset of internal scan chains which now are to be observed (instead ofbeing masked).(d) Such forms of selective control can be enabled on a per ATPG run ora per ATPG pattern or a per pattern cycle basis, providing completeflexibility for the ATPG tool to choose between or anywhere in betweenthe extremes of full compression and full bypass modes, mechanisms forwhich are believed to be neither supported in the scan compressionarchitectures nor the corresponding ATPG tools offered by commercialvendor DFT solutions.(e) The solutions proposed are scalable such that any combination ofinternal scan chains can be selected or a fixed set of such combinationsare permitted. This flexibility is dependent upon the type of controlhardware included for additional observability.

Improved diagnostics and reduced test times both benefit from the newobservability techniques described here.

In FIGS. 1-3, the structures and processes help to selectively propagatethe internal scan chain contents onto the scan outputs without thecompactor (thereby helping identify the failing flip-flops uniquely),with no additional support required from the ATPG tool. In a secondcategory of embodiments of FIGS. 5-7, on the other hand, sets ofinternal scan chains are selectively propagated onto the scan outputswith the compactor in the loop. This helps reduce the test time ascompared to a bypass mode of scan chain operation. In this case, an ATPGtool can exploit the programmability and availability in theobservability mechanisms to selectively propagate the desired scanchains on either a per-pattern or per-cycle basis.

Remarkably, the various forms of selective control can be enabled on aper ATPG run or a per-ATPG-pattern or a per-pattern-cycle basis,providing complete flexibility for the ATPG tool to choose between theextremes of full compression and full bypass modes, mechanisms for whichare believed to have been neither supported in the scan compressionarchitectures nor the corresponding ATPG tools hitherto. Restrictionsare obviated so that architectures and tools can go beyondpre-determined sets of scan chains (fixed by the scan compressionarchitecture) and beyond fixed control for all the cycles in a givenpattern set.

Some of the embodiments herein provide mechanisms that can be operatedto replay a failing pattern applied iteratively N/n times. For each suchiteration, n internal scan chains are directly observed, where n is thenumber of primary scan outputs and N is the number of internal scanchains. A number of accesses can be N divided by the number n ofinternal scan chains. No pattern re-generation is needed in thisstructural and process mode herein. Accordingly, regeneration, which maynot guarantee the same internal state of the circuit for the failingpattern as for the iteratively applied pattern, has such risk obviatedherein as well.

Some further advantages, among others, of various embodiments hereininclude:

(a) No regeneration of patterns for diagnostics.

(b) No re-load of patterns into the ATPG tool for diagnosticsinformation on failing flip-flops.

(c) Same internal circuit state for diagnostics as that corresponding tothe pattern failure.

(d) No need to resort to scan bypass mode ATPG patterns either fordiagnostics or for internal scan chain isolation.

(e) Ability to select any combination of internal scan chains forobservation or masking.

(f) Ability to select a reduced set of combinations (not fixed but withreduced programmability) with reduced observability mechanism controlhardware.

(g) Ability to optionally include or exclude the compactor logic,thereby providing the right controls for targeting desired test datavolume and test time compression as well as attaining desireddiagnosability, independent of the amount of X-content in the DUT.(h) Ability to interface this hardware to the ATPG tool to control theselection as well as masking/enabling feature on a per ATPG run, perATPG pattern and per pattern cycle basis.(i) De-coupling the ability for internal scan control from the availablenumber of primary input pins, thereby providing better control andbetter compression.(j) Ability to use constrained ATPG patterns (say, due to manufacturingand design conditions—with several masks across flip-flops and scanchains) normally applied for debug also for production test, withoutsignificant penalty since the output compactor is retained, (and withoutresorting to non-compressed scan bypass mode patterns).

TABLE 1 GLOSSARY ATPG: Automatic Test Pattern Generation. Using vendortools to generate patterns to check the quality of silicon duringproduction. Generally refers to the stuck-at fault test patterngeneration. Also can refer to I_(DDQ) (static current into chip) anddelay test pattern generation. BIST: Built-In Self Test. Internalcontroller logic designed to apply stimulus to test a block of logicwithout applying test vectors (software). May refer to Memory BIST.Bypass Pattern: Access from tester to internal scan chains inside DUTwithout CoDec logic, i.e. a pattern generated when CoDec is bypassed.CDR/PI/scan-ff: Core Data Register/Primary Input/scan-flip-flop. Someembodiments replace with programmable register for test mode control.CoDec: Compressor (Compactor) and Decompressor (forming the scancompression logic inside the DUT). Compiled TDL: TDL compiled in testerlanguage. DFT: Design for Test. DUT: Design Under Test EDT: EmbeddedDeterministic Test. IDDQ: Quiescent power supply current. I/O: I =Input, O = Output. IP core: Intellectual Property core (internal detailsnot necessarily known to tester) IR/DR: Instruction Register/DataRegister. JTAG: Joint Test Action Group, more commonly referring to theIEEE 1149.1 Standard, which defines the Test Access Port (TAP) andboundary scan design at the chip level. Modular pattern -Setup pattern,VVS - Compiled Pattern in tester format One-hot: Only one of the manywill be selected. One-hot decoder: Only one of the possible outputs ofdecoder will be selected. PE: Product engineers Scan: Structural testmethodology that places the chip in a special scan state where virtuallyall functional flops are connected into one or more shift registersaccessible to the tester, permitting test stimuli to be applied, andresponses to be collected. Setup/Header content: Control bits toconfigure the TAP controller (not the bits for the scan chain) orequivalent logic for test mode and ATPG setup. SI/SO: Scan In/Scan OutSOC: System on Chip Spf: STIL protocol file. STA: Static Timing AnalysisStatic X in a flip-flop: Flop having constant unknown value contentduring scan operations. STIL: Standard Test Interface Language, standardlanguage for test patterns STIL/TDL patterns: Standard Test InterfaceLanguage/Test Description Language patterns. STUMPS: Self-Test UsingMISR and PRPG Structures. Refers to internal smaller scan chains forscan-ins/scan-outs TAP: Test Access Port. Defines I/O and state machinefor test mode access. Timing X: An unknown value X content due to atiming error. TFT: Transition Fault Test: Generating patterns that candetect slow-to-rise and slow-to-fall faults. VLCT: Very Low Cost Tester.X-tol: Unknown value tolerance X-content: X values, where X denotesneither Boolean ‘1’ nor Boolean ‘0’, i.e. unknown value content, e.g.,in uninitialized storage cells, etc; or ‘don't care’ value can be either1 or 0, or flip-flop is of no interest; non-deterministic state, orwrong (not-expected) state value. 1500: IEEE1500 standard for core basedtesting, similar to JTAG 1149.

Effective and efficient debug of compressed scan patterns has hithertobeen problematic. Compressed scan chains can be difficult to debug bothin simulations and in tester because for any given pattern the toolcould have a number of internal scan chains getting compressed into thescan channel output.

In FIGS. 1-3, a first type of embodiment for compressed scan chaindiagnosis uses an internal chain observation structure to solve thisproblem. The structure provides a multiplexer 150 in parallel to thecompactor 130 of the on-chip scan compactor logic. Multiplexer 150selects and controls which internal scan chain is observed at its outputwhen an X-tol Mode is selected at a Multiplexer 140. The chain/channelselections in each of muxes 150 and 140 are flexibly controlled andachieved by programming Control Data Registers CDR 310 and 320 of FIG. 3to provide the selections. Such registers can be established forpurposes herein by allocating register fields in JTAG TAP (test accessport) circuitry or analogous IEEE1500 circuitry of FIG. 8.

Also, circuitry at the input of compactor 130 coordinated with mux 150in some embodiments is suitably provided to omit the outputs of scanchains selected by mux 150 from reaching the input of compactor 130. Leta test sequence initially feed compactor 130 with all N scan chains, andsuppose the output of compactor 130 (e.g., n lines wide) fails to matcha pre-determined pattern expected by the ATPG for all the scan chainsthus compacted. Then internal bypass Mux 150 is applied with selectionsuntil the output of compactor 130 matches a pre-determined patternexpected by the ATPG for the remaining compacted scan chains. At thatpoint, the scan outputs of Mux 150 can be expected with good probabilityto hold whatever unknown X's or problematic occurrences that call forfurther analysis at the tool or elsewhere in a testing system. In someother test process embodiments, the N scan chains are masked to dividethem into sets of progressively-halved numbers in successive steps ofthe sequence. If the compactor 130 output of compactor 130 (e.g., nlines wide) in a given step matches a pre-determined pattern expected bythe ATPG tool for all the scan chains thus compacted, the scan chainsmasked in that step probably hold the X's, else if the compactor failsto match then both sets of the scan chains (masked or unmasked) may holdX's. Then in the next step the masking is reduced by half on each setthat may hold X's. In due course, the sequence identifies which set(s)of scan chains hold X's, and the flip-flop states in the scan chains ineach such set are then individually compared with expected states toidentify probable X flip-flops. Other systematic search sequences of anysuitable deterministic or random type can be applied as well, orinstead, to identify which scan chains are failing in the sense thatthey have one or more X values in them.

Note in FIG. 3, the real estate economy and time-efficiency representedby the small number log₂(N/n) of CDR bits binary-decoded toselect-control the multiplexer to specify any particular one of N/nchain selections as well as the mux 150 circuitry to output the selectedset of n chains. By contrast, to individually specify each of theselected n chains could take n log₂(N) CDR bits and involve a muchgreater and less-economical amount of mux 150 circuitry. In FIG. 3, theselector circuitry of some embodiments selects a number n of the scanchains out of all of said scan chains while the CDR has substantiallylog₂(N/n) bits to specify the number n of the scan chains for selectionout of a total number N of said scan chains. That way, the programmableCDR can, in some of these embodiments even have fewer bits (i.e.,log₂(N/n)) for select-control of scan chains than the number n ofselected scan chains. This occurs whenn+log₂(n)>log₂(N)  (1)

For instance, with N=1024=2¹⁰ total scan chains, Equation (1) issatisfied with a number as few as n=8 or more of selected scan chains.In the case of n=8, only 7 bits specify a given set of eight scan chainswhile, by contrast, individually addressing the scan chains wouldinvolve 80 bits (10-bit addresses times 8 scan chains). Associatedaddressing hardware that would be needed is dramatically reduced, andthe time to program and operate the circuitry is shortened. Some otherembodiments also have a counter circuit and byte-wide register fields todefine range ends for the counter so that scan chains are progressivelyaddressed set-by-set in sets of e.g. eight chains each, then the currentset is scanned out serially eight-wide, and the counter advances toselect the next set. A counting mode bit, when set, activates suchcounting circuit.

No need arises, as has apparently existed hitherto, for generating anuncompressed pattern using a particular tool nor to go through lengthysimulations for debug. No need arises for regenerating scan patterns,which implies or demands that the exact pattern set (or faultexcitation) that caused the fault that is getting debugged beregenerated. Thus, the concomitant risk is obviated here, viz. that thisexact pattern set will not be perfectly regenerated. If bypass patternsare generated using bypass logic in the DUT, the same fault could beobserved, but it is not guaranteed that the other scan flip-flops are atthe same identical state as in the compressed pattern.

In a process or method embodiment herein, tool based diagnostics areobviated. Moreover, as shown later hereinbelow, the process or methodembodiments herein can offer or show better fault resolution thantool-based diagnostics.

The process embodiment in FIG. 4 remarkably uses the existing patternset (ASCII and TDL) to create a new TDL with the internal chain databrought out in the scan out. It has minimal impact on area and almost noimpact in timing since it is in the scan out path. It has nocomplications such as regeneration of patterns, setting up a new toolflow, relying on Product Engineering team providing data logs in aparticular format, etc. The inputs suitably are the ASCII files, TDL,and the Fail log from VLCT that shows which scan channel and pattern isfailing. The script takes care of copying the internal scan chain datathat exists in an ASCII file onto the new TDL. For each failing pattern,the process creates a new TDL. All the internal chains are brought outto the top scan out pins, one set of scan chains (equal to the number oftop level scan out pins) per pattern. The results can be handed off toProduct Engineering swiftly. The first pattern set brings out the firstset of internal scan chains to the scan output channels, the secondpattern set brings out the second set of internal scan chains to thescan output channels, etc.

In FIG. 4, suppose scan pattern ‘1’ is failing in scan channel ‘0’.Then, in effect, scan pattern number ‘1’ is copied from ASCII onto TDL ntimes (where n is the number of internal Scan Chains for that particularScan Channel), and the internal chain data are brought out one after theother in these new patterns in the new TDL. Since the data is beingbrought out from internal Scan Chains, and the processing compares themwith expected data also corresponding to internal Scan Chains, theprocess can in effect narrow down on all failing flip-flops at one go orone pass. In case of tool based diagnostics, the process will identify asuspicious single flip-flop if possible or will identify a set offlip-flops as possible suspects in case more than one chain is gettingcompacted into the Scan Channel. Hence, the process or method embodimentgives better resolution without having to do tool based diagnosis. (Seealso description of FIGS. 10-11 later hereinbelow.)

The details of Scan Chain data being reflected or observed on a ScanChannel are illustrated in FIGS. 1 and 2, which show a structuralembodiment to observe internal Scan Chains, which can be provided as asection of the solution or a modification to an existing scancompression solution. In FIG. 1, the structure and process are set orconfigured for observing 1st internal scan chain 120.1 at scan out. InFIG. 2, the structure and process are set or configured for observing asecond internal scan chain 120.2 at scan out.

Integrated circuit manufacturers and their customers can benefit fromuse of these embodiments. Any work groups who use compressed ATPGpatterns in their test suite can benefit from these embodiments ofstructure and process to achieve faster debug cycles. These embodimentshelp facilitate easier, swifter and more effective debug of patterns.The patterns are one-to-one compatible with the patterns delivered toProduct Engineering function. Since, the scan testing structures on-chipare supposed to promote debug itself, the identification of any bugs inthese scan testing structures should be swift and effective. Theseembodiments help narrow down on each failing scan flip-flop swiftly andeffectively so that silicon debug focus can be on debugging othernon-scan possible contributing reasons for silicon failure like STA(static timing analysis issue), IR (current-resistance) voltage drop,etc.

Conventional X-tolerant approaches have limitations. For example, inscan compression a large number of internal scan chains get compactedinto fewer external scan outs, thereby reducing observability. Amongother implications, this means that conventional scan compressionimpedes debug since resolution is poorer, and it impacts coverage sinceoutput is corrupted—due to Xs. Scan chains with X-content masknon-corrupted ones being observed on the same outputs. Compression isreduced since more patterns are required to overcome the just-mentionedpoor resolution and corrupted output problems.

Various embodiments are provided for design and automation forcompressed scan pattern diagnosis by using internal scan chainobservation. Various embodiments, in the presence of scan compression,provide architectures for better debug, compression and X-handling.Debug capability is dramatically improved by identifying failingflip-flops using existing patterns without reading them back into ATPGtool and with no iterations. Conventional methods currently are believedto be very iterative, i.e., involve many iterations.

Various embodiments provide complete control (user selectable or toolselectable) to mask or observe any amount of X-content in internal scanchains. Current mask solutions are believed to operate coarsely (ingross) and inefficiently, which leads to coverage loss that in turnleads to pattern inflation.

The embodiments flexibly accommodate and utilize any compression toolsfamiliar to the industry. Any of a variety of Compactor-Decompressor(CoDec) configurations can be used together with the observability anddiagnosis process embodiments. For example, decompressor 110 suitablyhas any one or more of mux-decompression, XOR (exclusive-OR)decompression, or LFSR (linear feedback shift register) decompression,or other decompression technologies. Compactor 130 suitably has any oneor more of XOR-tree compaction, MISR (Multiple Input Signature Register)compaction, or other compaction technologies.

In FIGS. 1, 2 and 3, an architecture diagram depicts an embodiment fordebug of compressed patterns.

In FIG. 3, the internal scan chain selection and debug bit arecontrolled using IEEE1500 controller CDR bits (WS_USER_DMLED_TESTID)

In FIG. 4, a process diagram depicts a flow for preparing or generatingpatterns that accommodate X-content and uses the circuit of FIG. 3, forinstance. In FIG. 4, a flow diagram for debug pattern generation showsfour file sources of inputs for 1) Spf/testproc, 2) Failing ASCIIpattern, 3) Failing TDL/VVS. A fourth file source provides a filecontaining information of the mapping of failing patterns to failingscan chains (scan flip-flops) on a per pattern (per cycle) basis. Forone example of implementation, a software script is suitably written inpracticing some versions of the process embodiment of FIG. 4 for copyingor converting the ASCII data for internal Scan Chain to TDL (testdescription language of the tester) as Scan Channel data. The failingpattern, original ASCII file, testproc/spf file, etc., are used asinputs to a PERL script. The PERL script takes the failing log and thefailing pattern information and generates debug patterns by bringing outeach internal scan chain out to the scan channels. So, if 128 internalscan chains are compacted into 4 external scan channels, for a failingpattern 128 new debug patterns can be generated such that each internalscan chain is brought out to the top-level scan channel. Some otherprocess embodiments alternatively generate 128/4=32 debug patterns and32 accesses to obtain four internal scan chains at a time through thefour external scan channels. Other numerical examples can readily bedevised also.

Some further embodiments combine and/or replicate any one or more of theembodiments in FIGS. 1-3 and FIGS. 5-7 and mux their inputs and outputsto scan interface circuitry such as IEEE 1500 of FIG. 8.

In FIGS. 5, 6 and 7, some embodiments provide observability through thecompactor, resulting in higher compression to compensate or reducepattern inflation. These remarkable observability mechanisms areincorporated into scan compression architectures for improveddiagnostics and reduced test time. Herein, they interface with ATPGtools to provide for selective internal scan chain control (isolation orenabling) for better debug/diagnostics, and better ability to handleX-content in scan flip-flops. The output compactor structure andfunction are valuably retained and utilized. It is unnecessary to resortto a scan bypass ATPG mode.

In FIG. 5, an embodiment X-Tol Arch-1 provides better debug/compression.A scan clock 502 is coupled via an AND-gate 504 when enabled by a Scancontrol signal to scan information into and out of scan chains 520.iprovided as testability structures in a functional integrated circuit.Decompressor 510 has a large demux to route scan bits fromtester/emulator channels 420 to internal chains 520.i. The embodimentsflexibly accommodate and are independent of industry standardcompression tools. The chains 520.i are clocked by scan clock to bringthe image bits out to the Compactor 530. The Compactor 530 has amulti-stage XOR Tree (circle-(X)). 1024 register cells in register 560for 1024 STUMPS (mask code registers) provide observability andmaskability for each STUMP. In this FIG. 5 architecture, N internal scanSTUMPS use N shift register cells in register 550 and N data registercells in register 560, where N=1024 in this embodiment. Consider an,e.g., 8-wide XOR compactor output, where the compactor 530 is organizedin eight segments to provide the 8-wide compactor output labeledoutput_channels[7:0]. Scan out up to eight (8) individual STUMPS at atime, with each STUMP situated in a different set of 1024/8=128 scanchains. Respectively scan each of the eight STUMPS out through acorresponding one of the eight compactor 530 segments respectively.Doing so does not compact the eight STUMPS with each other and therebyprovides STUMP-individualized scan outputs without any bypass muxhardware.

In FIG. 5A, 1024 mask code registers 592.i are in mask code circuitry590 for 1024 STUMPS 520.i. In the mask code circuitry 590, a set of 1024three-input AND-gates 596.i together with the mask code registers 592.iprovide observability and maskability for each STUMP. In FIG. 5, a linedesignated Input channel[7] is any of CDR/PI/scan-ff and controls the2:1 selector input of a Mux 580 (2×1024:1×1024). A 1024-wide output line585 from Mux 580 has individual lines 585.i that respectively qualify ordisqualify each AND-gate 596.i in FIG. 5A. Some embodiments omit theregisters 592.i.

In FIG. 5, operation of the embodiment architecture is described below:

-   -   1. While scanning data in the design DUT (e.g., 810 of FIG. 8),        mask shift registers 550 (and 592.i when included) are also        programmed using decompressor 510 because shift register chain        540, 550, 555, 592.i is also treated or assumed by FIG. 4        process 410 at tester 420 as one of the scan chains. The        scannable masking qualification circuit 550, 560, 580 is thus        programmable by scan-in of bits by decompressor 510 along with        scan-in of the scan chains 520.i. Values are shifted-in under        control of process 410 on tester 420 based on the        previously-discovered X-content of the chain. For example, if        FIG. 5 chain 520.44 has some X content and should be blocked,        then shift_reg_44 (550.44) is shift-loaded with ‘0’ as part of        and by the end of the shift-in process. All other shift register        cells 550.i are illustratively loaded with ‘1’ as part of and by        the end of shift.

When scan enable signal ‘scanen’ changes state, shift register 550 datais loaded into data registers 560. In this way, the scannable maskingqualification circuit 550, 560, 580 locks in such scanned-in bits andholds those bits upon scan-out of scan chains 520.i as they scan outthrough mask code circuitry 590. The bits in register 560 remain inplace while information is scanned out of scan chains 520.i and thus thescannable masking qualification circuitry 550, 560, 580 is at leastpartially isolated from control by the scan-out circuit 502, 504 onscan-out. On scan out, some embodiments also do scan out the bits inregister 550 to the compactor 530 and thereby include the bits inregister 550 in the compacted pattern and confirm that those bits weredecompressed by decompressor 510 and scanned in. Thus in the latterembodiments, the compactor 530 is also fed by register 550 forcompaction of such scanned-in programming bits upon scan-out whileregister 560 holds such scanned-in programming bits.

-   -   2. Data register values 560 are muxed by mux 580 and provided to        blocking (AND) logic 596.i of FIG. 5A. The Mux 580 selector        input is called X-tol enable, which selects whether X-tolerance        is used or not. X-tol enable can be controlled through top level        pin or a core data register CDR or automatically by FIG. 5B Xtol        generator 575, which acts as a control signal generator operable        to supply a varying control signal to modulate the masking        qualification circuit on various scan out cycles to qualify and        disqualify one or more scan chains 520.i.    -   3. While shifting out, if there is an X content in a particular        shift position, X-tol enable can be set to ‘1’ for that shift        cycle. If Chain 520.44 has an unknown X at shift position        j=0.120 (520.44.120), see FIG. 5 inset, then data_reg_44        (560.44) will be loaded with ‘0’, and for the 120^(th) cycle        X-tol enable will be set to ‘1’.

In FIG. 5B, a detail of Xtol generator circuitry 575 and its operationscontrol that illustrative 120^(th) cycle of scan out. A counter 910clocked by Shift clock 920 counts the cycles of scan out and feeds thecount to a comparison input A of each of, e.g. four, comparators 940.i.Several scan-configurable registers 930.i can hold one or more positionvalues of position j, typified by j=120 along chain 520. Registers 930.icouple the position values stored therein respectively to correspondingB inputs of the comparators 940.i. A multi-input OR-gate 950 suppliesactive Xtol output from Xtol generator circuitry 575 when any of thecomparators 940.i detects a match (making equal “=” output active). InFIG. 5, mux 580 ordinarily provides universal qualification 1024b1 tothe FIG. 5A AND-gates 596.i so that they mask on the basis of whatevermask the tester has shifted into and provided to the mask registers592.i. However, on one or more cycles (if any) for which an unknown X isto be masked (e.g., cycle 120), mux 580 responds to Xtol generatorcircuitry 575 and passes 1024 control signals from data register 560.ithrough mux 580 and to the respective qualification input of eachAND-gate 596.i. Given that Chain 520.44 is to be masked at cycle 120,Xtol enable is activated at cycle 120, and a masking zero from register560.44 is fed to disqualify AND-gate 596.44 from passing the unknown Xfrom chain cell 520.44.120 to compactor 530 on cycle 120.

Note also, that by differently loading shift register cells 592.i andshift register cells 550.i, a variety of synergistic scan-out patternscan be obtained using X-tol modulation, i.e. ability to control theX-content that is blocked or passed. One example of operation loadsshift register cells 592.i to apply zeroes (0) to mask all of the scanchains 520.i except for a particular set of them for which ones (1) areapplied. Concurrently, shift register cells 550.i have been loaded toapply zeroes (0) to mask one or more of that particular set of scanchains when X-tol is active on a given cycle. This way, when X-tol isinactive, the 1024b1 universal qualification is selectively prevented byshift register cells 592.i from qualifying all the scan chains 520.i forcompaction by compactor 530. Some other embodiments also provide modeswherein the logic represented by AND-gates 596.i is made mode-dependentso as to provide various Boolean minterms or composite logic functionsinvolving AND, OR, and NOT and other logic circuit equivalents. In someembodiments, the operation is set up reversely or additionally, whereinmux 580 has 1024b0 universal disqualification zero inputs thatdisqualify all AND-gates 596.i unless a masking one (1) is fed from agiven register, e.g., 560.44. Still other embodiments replace the 1024b1or 1024b0 with the shift register cells 592.i outputs themselves. Someother embodiments save real estate by also providing a few mode bits(e.g., 2 or 3 of them) to additional selector lines of mux 580 to selectbetween several hardwired mux 580 inputs provided with additional valuesanalogous to 1024b1 or 1024b0 but that can mask off various sets of scanchains, or all but such various sets. By various embodiments, theremarkable operations effectively modulate, switch or substitutedistinct masks depending on the state of X-tol, Some embodiments omitshift register 560 (and the like in FIGS. 5-7) and feed the mux 580directly from shift register 550, and connect mux 580 to an input 1024b0while scanning-in register 550.

Benefits of the FIGS. 5, 5A, 5B embodiment include, among other things,that it provides observability of each STUMP at top-level scan outs.Xtol generator circuitry 575 together with mux 580 and AND-gates 596.ican provide per-cycle shift cycle masking. If there is a static X in aflip-flop 520.i.j, only in that shift position j is the X-Tol modeenabled. Only part of a pattern remains uncompressed. No limitation onnumber of STUMPS, nor any grouping limitation, is imposed. Compactor 530is not bypassed in X-Tol mode, hence the embodiment provides bettercompression in presence of Xs. This FIG. 5 embodiment is useful whenextra registers (2N, e.g., 2048) are acceptable from a real-estateviewpoint. One of the scan-ins is used as X-Tol enable and acceptablyincreases scan-in pattern bits a little.

In FIG. 6, another embodiment X-Tol Arch-2 provides betterdebug/compression as follows. Decompressor 610 has a large demux toroute scan bits from tester/emulator 420 channels to internal shorterchains 620.i. The chains 620.i are clocked by scan clock to bring theimage bits out to the Compactor 630. The Compactor 630 has a multi-stageXOR Tree. As regards compactors 130, 530, 630, 730 herein, other typesof compactor circuits may also be used instead or in combination.

In FIG. 6A, 1024 mask code registers 692.i for 1024 STUMPS provideobservability and maskability for each STUMP 620.i. Some embodimentsprovide fewer mask code registers 692.k than the number N of STUMPS tomask off the scan chains 620.i in sets k. In some embodiments, theseregisters 692.k are connected to sets k of the AND-gates 696.i andarranged to independently mask or not mask the same sets k of the scanchains as those defined by the wiring of lines 685.k to AND-gates 696.i.In some other embodiments, these registers 692.k are arranged toindependently mask or not mask sets of the scan chains that aredifferent sets from and/or overlap with those sets defined by the wiringof lines 685.k to AND-gates 696.i.

In the FIG. 6 embodiment, N internal scan STUMPS 620.i are grouped in(N/n) groups where n=Top level output_channels (in above figure assumeN=1024, n=8, so total number of groups=128). Each group has n stumps,128 register cells in shift register 660 for 1024 STUMPS. Mask codecircuit 690 in FIG. 6A provides observability and maskability for eachgroup of 8 STUMPS. Mux 680 is fed an Xtol enable from an Input Channel,such as CDR/PI/scan-ff. In this embodiment, masking ability andobservability are provided for every group (instead of every STUMP as inFIG. 5). Hence every group 0<=k<=127 has a shift register cell 650.k anddata register cell 660.k to support and qualify or disqualify thecorresponding masking circuit group 690.k having FIG. 6A mask controllogic 690.0-.7, 690.8-0.15, . . . 690.1016-.1023, where i/8=k. So for1024 internal STUMPS and 8 external output_channels, i.e. [7:0], 128groups and hence 128 shift registers 650.i and 128 data registers 660.iare provided. Thus, shift register 660 includes a set of shift registercells, and each cell 660.k in the set is operable to select acorresponding plurality of scan chains 620.i corresponding to such cell660.k for qualification or disqualification of that plurality of scanchains in tandem.

Operation of the FIG. 6 embodiment is described next:

-   1. While scanning data into the design DUT 810, mask shift registers    692.i are also programmed using decompressor 610, since the shift    register chain 640, 650, 655, 692 is also treated or assumed by    process 410 on tester 420 as one of the scan chains. Values are    shifted in based on the X-content of each chain 620.i and its group    k=i/n. For example, if chain 620.44 has some X content and it is in    group 5 (k=44/8), then all the 8 chains of group 5 are blocked in    order to block chain 620.44. For this, shift_reg_5 (650.5) is loaded    with ‘0’ as part of and by the end of shift-in. All other shift    registers 650.i are illustratively loaded with ‘1’ as part of and by    the end of shift-in.-   2. When scan enable signal scanen changes state, shift register 650    data is loaded into data registers 660. The data register 660 values    are muxed by mux 680 and provided to blocking (AND) logic. Mux    selector is called X-tol enable, which selects whether X-tolerance    is used or not. X-tol enable is controlled through a top level pin    or a core data register CDR or by Xtol generator 675 as described in    FIG. 5B.-   3. While shifting out if there is an X content in a particular shift    position, X-tol enable is set to ‘1’ for that shift cycle. If chain    620.44 (group 5) has an unknown X at shift position 120 then    data_reg_5 (660.13) is loaded with ‘0’ and on the 120^(th) cycle    X-tol enable is set to ‘1’. On that 120^(th) cycle, chain 620.44    along with the other chains in its 8-chain group has output masked    by AND-gates 695.40-.47 in FIG. 6A masking circuit 690.

Advantages of the FIG. 6 embodiment include, among other things, that itprovides observability of each STUMP at top-level scan outs. It providesper-cycle shift cycle masking. If there is a static X in a flip-flop,only in that shift position is the X-Tol mode enabled. Only part of apattern remains uncompressed. No limitation on number of STUMPS isimposed. This FIG. 6 embodiment does not bypass Compactor 630 in X-Tolmode. If there is X-content in a chain, only the particular 8 chains ofthat group are blocked in tandem and all other groups are or can becompacted. This FIG. 6 embodiment thus still provides better compressionthan traditional one-hot decoder based architecture. This embodimentalso has less area overhead compared to the embodiment of FIG. 5 becausefewer registers 650.i, 660.i are used.

This FIG. 6 embodiment uses 2N/n additional register cells in shiftregisters 650, 660 and is useful when fewer (e.g., 256) additionalregisters are preferred than in FIG. 5. A scan-in line Input channel[7]is used as X-Tol enable, which represents an acceptably small increasein scan-in pattern bits. Scan chains are grouped in X-Tol mode. If onechain is masked, the other chains (e.g. 7) of that group k are alsomasked in X-Tol mode.

Additional mixed embodiments can be prepared, such as ones combining themasked compaction of FIG. 6 with the bypass mux circuit 150 of FIG. 3.In some embodiments, the circuitry of the compactor 630 is optimized andoperated in response to an additional CDR mode bit so that when some ofthe compactor 630 is masked, then the logic circuits in the compactor630 are re-used to simultaneously perform and deliver a bypass muxoutput for the masked portion. Some other embodiments simply have a modebit to invert the entire mask at masking circuit 690 and the outputs ofmasking circuit from that set k are hardwired to the inputs respectivelyfor the n compactor 630 segments. The selected set k of scan-chains isthereby scanned out through the compactor 630 effectively uncompactedafter determining in steps 1-3 hereinabove that compaction of all scanchains except for that set provides the compacted output expected fromproper functioning.

In FIG. 7, another embodiment X-Tol Arch-3 for better debug/compressionhas a line 740 that carries signals from Decompressor 710 to ShiftRegister 750. The signals are controlled dynamically per-cycle orstatically per-pattern under External control or decompressor 710output. Shift register 750 is parallel coupled to data register 760.Data register 760 provides a 7 bit register 760.k for each group k ofSTUMPS, and thereby provides observability of any 8 STUMPS across thegroups. (The multi-bit nature of each of the n registers 750.k and 760.kis represented in FIG. 7 by a center bar inside each register box.)

Each one-hot decoder 770.k provides a decoder circuit based on binarydecoding of input signals, 0<=k<=7. A particular 128-bit binary signalat the 2⁷=128-bit-wide output of the decoder 770.k is generated by thedecode circuit in decoder 770.k in response to 7 bits from thecorresponding data register 760.k. Notice that shift register 760 has 8sets of 7 bits each. In response to each of these eight sets a 7-to-2⁷bit decoder 770.k provides 128 bits (2⁷) as output. Eight such outputsfrom the eight decoders 770.k together form, or are concatenated toform, 1024 bits and fed to mux 780. Mux 780 responds to a one or zeroselector input Xtol, such as from any of a CDR, PI, scan flip-flop, orInput Channel[7] from Xtol generator 775 to select either 1024 one-bits(1024b′1) or the 1024 bits from the eight decoders 770.k. Some otherembodiments augment the 1024b′ 1 input with other hardwired mux 780inputs or with shift register-based circuits analogous to the discussionof various embodiments related to X-tol controlled mask switching inFIG. 5.

In this FIG. 7 embodiment, N internal scan STUMPS are grouped in ngroups, where n=top level output channels (in above figure assumeN=1024, n=8, so total number of groups=8). Each group has (N/n=128)STUMPS. A 7-bit register for each group of STUMPS provides observabilityof any one STUMP in a group k, and of any 8 STUMPS across the groups. Inthis embodiment, masking ability and observability are provided for anyn chains (e.g., 8) across the groups. In X-tolerance mode, only 1 STUMPis observed in one group and any combination of STUMPS across groups canbe observed. For example, suppose there are 8 groups and each group has128 STUMPS. Group1 has (0-127), Group2 (128-255) . . . Group8(896-1023). Hitherto, grouping limitations have existed. For example, ifchain 0 is to be observed on channel 1, only a specific combination ofSTUMPS could hitherto be observed on other output channels (0,128,256 .. . 896). But with the FIG. 7 architecture, the grouping limitation isovercome and eliminated. For example, if chain 0 is to be observed onchannel 1, then on other channels any combination of STUMPS can beobserved ([any one of [128-255], any one of [256-383] . . . , any one of[896-1023]). With an, e.g., 8-wide XOR compactor output, scanning out upto eight (8) individual STUMPS, one in each 128-wide set of STUMPS, isreadily accomplished directly through the compactor 730 without anybypass mux whatever. Introducing control registers 760.k for every groupk provides this flexibility, and introduces log₂(N/n) shift registerbits and data register bits per group. Hence, a total (n*log₂(N/n)=56)shift and data registers are used.

Operational flow is described below:

-   1. While scanning data into the design DUT 810, FIG. 5A mask shift    registers 592.i are also programmed using decompressor 710 since the    shift register chain 740, 750, 755, 592 is also treated or assumed    by process 410 on tester 420 as one of the scan chains. Values are    shifted in based on the X-content of the chain and its group. For    instance, if chains i=[0,144,273,425,611,754,895,922] are to be    observed, then shift register 750 (shift_reg[0-55]) is loaded with    the following values that then go to data register 760. The values    in data register 760 are equal to the binary difference of each    hypothetical chain number i less the base value 128 k for the group    0<=k<=7 in which that chain number lies.    [0000000_0010000_0010001_0101001_1100011_1110010_1111111    _(—)0011010].-   2. When scan enable signal scanen changes state, shift register 750    data is loaded into data registers 760. Data register 760.k values    are one-hot decoded by decoders 770.k and provided via 1024 mux 780    output lines 785 to FIG. 5A blocking (AND) logic 596.i. The Mux 780    selector line is designated Xtol enable, which selects whether    X-tolerance is used or not. Xtol enable is suitably controlled, such    as through a top level pin or a core data register CDR or by Xtol    generator 775 as described in FIG. 5B.-   3. While shifting out, if there is an X content in a particular    shift position then X-tol enable is set to ‘1’ to select the one-hot    decoders 770 for that shift cycle. Suppose Chain 44 (group 0=44/128)    has an unknown X at shift position 120. Then for the 120^(th) cycle    X-tol enable is set to ‘1’. Data register 760 is appropriately    loaded with 56 bits that are decoded by one-hot decoders 770 to    generate all ones except for a zero to disqualify FIG. 5B AND-gate    596.44 in FIG. 7 mask circuitry 790. Any chain other than chain 44    can be observed from group 0 at top-level output_channels.

Advantages of the FIG. 7 embodiment include, among other things, that itprovides observability of each of n independently-specified STUMPS attop-level scan outs. It provides per-cycle shift cycle masking. If thereis a static X in a flip-flop at chain i shift position j, then only inthat shift position j will X-Tol mode be enabled. Only part of an entirescan pattern or bit-image in the functional integrated circuit willremain uncompressed. No limitation on number of STUMPS is imposed. Nogrouping limitation exists either.

That way, if the compacted output is as expected by using compactor 730to compact all chains 720.i except those selected in step 1, then thatoutput provides evidence that the failing chain(s) are indeed amongthose chains selected in step 1. These chains themselves are thensuitably scanned out in parallel through compactor 730 in effect aseight individual effectively uncompacted outputs by inverting the maskat mask circuit 790 such as by an invert-control (all-but) input to allthe AND-gates 596.i in FIG. 5B. Alternatively, a universaldisqualification input 1024b0 is provided as an input to mux 780, andX-tol enable causes mux 780 to select the 1024b0 input at each positionof an unknown X. The one-hot decoders 770 are arranged to generate allzeroes except for a one (1) to qualify FIG. 5B AND-gate 596.44 in FIG. 7mask circuitry 790 and likewise for each one of eight selected scanchains to be scanned out for further analysis.

This FIG. 7 embodiment uses n*log₂(N/n) register cells 760, and isuseful when only a relatively few (e.g., 2×56) additional registers withtheir decoding logic 770 are acceptable. One of the scan-in lines isused as X-Tol enable, which is an acceptable increase in scan-in patternbits. Compressor 730 is partly masked in X-Tol mode. Masking shiftregister 592 can be set to mask one complete chain 720.i if it needs tobe masked for production patterns.

Variants of the FIG. 7 embodiment use different numbers n of groups. Thenumber of decoders 770.k is equal to the number n of groups. The numberof registers in a register 760 is equal to n*log₂(N/n)=n*(10−log₂(n))when N=1024. TABLE 2 shows the parameters of some of these embodiments.An embodiment is selected by considering 1) the probability that morethan one chain in a same group may have an unknown, 2) the amount ofadditional decoding logic given number n and the internal complexity ofthe decode in each decoder from TABLE 2 value m to 2^(m), and the numberof additional register cells 2 n m.

TABLE 2 NUMBERS OF DECODERS AND REGISTER CELLS* n m = (10 − log₂(n))Register cells nm 4 8 32 8 7 56 16 6 96 32 5 160 *when chains N = 1024.

As TABLE 2 indicates, by choosing the right number of decoders andregister cells, a variety of intermediate solutions are possible withthis scheme, wherein the X-tol modulation control can be used forselecting individual or groups of internal STUMPS channels (with varyinggranularity).

Conventional architectures for X-tolerance are likely to bypass thecompactor if one or more scan chains are having shift failures. Thisresults in many or even most of the patterns being undesirablyuncompressed patterns in some scenarios, thereby impacting compressionin presence of Xs.

The embodiments and their architectures provide effective/efficientflows for debugging failures in compressed ATPG patterns. Theembodiments overcome limitations of scan compression implemented usingcommon industry standard tools and can deliver a better quality ofresults. The embodiments with observability mechanism for debug can beuseful to any digital design teams that implement scan compression. Scancompression can be applied to any large digital circuits, and the debugand X-tol control and other embodiments and teachings in this disclosureare applicable to all classes of digital circuits where scan compressionis used.

Various integrated circuits such as soft cores having the embodimentsshown in FIGS. 1-7 can be easily tested. ATPG setup with vendor toolsupported commands for different incremental ATPG runs help test theembodiments. Hard IPs with debug patterns delivered with non-identicalsets of scan out images for a given set of scan in image(image=pattern), when different qualification/disqualification patternsare delivered to data register 560, 660, or 760, indicate or signifyoperation of the embodiments. Hard IPs with STIL/TDL patterns have adifferent implied scan structure when some such embodiments areincorporated.

In FIG. 8, IEEE 1500 is used to setup/control many of the test relatedfeatures within the functional integrated circuit, or IP core, 810according to the FIG. 8 embodiment as improved in FIGS. 1-3 and 5-7. Inthis way, an interface couples chip-level test pins with a functionalintegrated circuit 810 and provides a test wrapper to allow access tothe functional integrated circuit 810. The test wrapper has a WrapperShift Register 820 for serial entry of instructions and data via aWrapper Shift Input WSI and can scan out resulting information atWrapper Shift Output WSO. A Wrapper Instruction Register 830 is coupledand controlled to receive the test instructions from Wrapper ShiftRegister 820. A Wrapper Data Register 840 is coupled and controlled toreceive the test data from Wrapper Shift Register 820 or conversely todeliver resulting data to Wrapper Shift Register 820 for serial scan outat WSO. A set of control signals NRESET, CLKREF, WRCK, WRSTN, SELECTWIR,SHIFTWR, UPDATE WR, AND CAPTUREWR control these operations.

Further in FIG. 8, an 8-wide input WPI[7:0] feeds a Decompressor 860 aswell as a Load Execute Dump LED interface and a programmable BIST orPBIST, interface. Decompressor 860 provides and sets up a bit-image forfunctional integrated circuit 810 to operate upon, and the LED and PBISTinterfaces are coupled to control what operations are to occur and betested. See FIGS. 1-3 and 5-7 for detail of circuits involvingDecompressor 860 and Compactor 870. A mux 875 has three inputsrespectively fed by a Compactor 870, by an output from the Load ExecuteDump LED interface, and by an output from the PBIST interface. Mux 875delivers an output to WPO[7:0]. Functional integrated circuit 810 alsohas boundary scan registers that provide Functional I/O and also have aserial input WBI[(W−1):0] and a serial output WBO. FIG. 8 is oneillustration of a particular test interface, and various embodiments maylack any of various features such as DMLED, PBIST, etc.

As noted, the embodiments in this disclosure are applicable, among otherthings, to all classes of digital circuits where scan compression can beused and to all types of systems using such circuits. A system contextis depicted in FIG. 9 and described hereinbelow, by way of example andnot of limitation.

In FIG. 9, a system functional integrated circuit chip embodiment 3500improved as in the other Figures has an MPU microprocessor unitsubsystem and an image and video acceleration IVA subsystem, and DMA(Direct Memory Access) subsystems 3510.i. See U.S. Patent ApplicationPublication 20080307240 (TI-60478) “Power Management ElectronicCircuits, Systems, and Methods and Processes of Manufacture,” which isincorporated herein by reference in its entirety. In FIG. 9, a Modemintegrated circuit (IC) 1100 supports and provides communicationinterfaces for any one or more of such embodiments. The systemembodiment examples of FIG. 9 are also provided in a communicationssystem and implemented as various embodiments in any one, some or all ofcellular mobile telephone and data handsets, a cellular (telephony anddata) base station, a WLAN AP (wireless local area network accesspoint), a Voice over WLAN Gateway with user video/voice over packettelephone, and a video/voice enabled personal computer (PC) with anotheruser video/voice over packet telephone, that communicate with eachother. A camera CAM provides video pickup for a cell phone or otherdevice to send over the internet to another cell phone, personal digitalassistant/personal entertainment unit, gateway and/or set top box STBwith television TV. Various production-testable and/or field-testablesystem embodiments are provided on a printed circuit board (PCB), aprinted wiring board (PWB), and/or in an integrated circuit on asemiconductor substrate.

Various embodiments of an integrated circuit improved as describedherein are manufactured according to a suitable process of manufacturing4000 as illustrated in the flow of FIG. 10. The process prepares adesign database in a step 4010 that has RTL (register transferlanguage), netlist, and transistor-level database with place-and-routefor a particular design that also has a scan decompressor and compactorcircuit and associated circuitry for testing the functional integratedcircuitry. The detailed description describes those examples and variousother alternatives. Another step 4020 develops an original compressedpattern set, and the design database is checked and verified in a step4030 using the pattern set. Any necessary modifications are made to thedesign database and the pattern set interactively until the verificationpasses (OK) in step 4030.

At a step 4040, the design database and the original compressed patternset are delivered from a design site, such as by download from a designserver, to a production site like a semiconductor integrated circuitwafer fabrication facility. A step 4050 employs the design database andutilizes fabrication equipment responsive to the design database tomanufacture the wafers, which have numerous actual integrated circuitunits, each called a die, based on the design data base and to which itpertains. Then the original compressed pattern set is desirably usedalso as basis for production scan test of the fabricated actual units ofthe integrated circuit. Production testing 4060 scans patterns from theoriginal compressed pattern set into the integrated circuits, and theATPG equipment scans out and checks the resulting patterns againstexpected patterns, see also FIG. 11. If the patterns match, the actualunit or die passes step 4060 as a good die or can go to a step 4070 forassembly, packaging, and subsequent further such testing. If thepatterns do not match, the production testing suitably goes through oneor more testing iterations and applies constrained test patterns. If thedie is irretrievably failed, then a record identifying it and thefailure is made, and at a step 4080 that particular die may beultimately scrapped. However, the testing at step 4060 may instead showthat the actual unit is sufficiently functional so that already-presentfault-tolerant features in firmware or simple hardware modifications inproduction, see step 4090, are sufficient to achieve intended full,reliable functionality and pass that integrated circuit unit. In thisway, production and design are more closely and efficiently coordinatedby using the original compressed pattern set as basis for productionscan test of the units.

FIG. 11 illustrates a test process that uses any of the scan circuitryof the other Figures and as taught herein. FIG. 11 can also be used as adetail illustration for the production testing step 4060 of FIG. 10. InFIG. 11, operations at step 4210 generate a masking pattern and X-tolcontrols, if any. (Initially, this masking pattern may be a null maskthat fully couples all the scan chains to the compactor.) A collateralstep 4215 derives an expected compaction pattern expected for theupcoming scan-out data. This expected compaction pattern is derived instep 4215 by applying to the transistor-level design data base a scan-inchain pattern from the original compressed pattern set that wasdelivered to the production/test facility subject to the step 4210masking pattern and any X-tol controls from step 4210. Another step 4220transfers into an actual unit of the chip under test the masking patternof step 4210 along with the scan-in chain pattern from the originalcompressed pattern set that was delivered to the production/testfacility and on which step 4215 is based. Thus, the original compressedpattern set is used at least in part as input to the production processand is decompressed into the integrated circuit unit. The functionalcircuitry of the chip under test is operated in a step 4225. Then a step4230 scans out the scan chains using masked compaction according to thesupplied masking pattern and X-tol controls, if any. A comparing step4235 compares the actual masked compaction data pattern of scanned-outbits, which results from actually performing the production scan test,with the expected compaction pattern from step 4215 to determine ifthere is a match. If a match, the test passes and further test patternscan be tested and if they match, the chip Passes.

If no match is detected at step 4235 for some test pattern, a step 4240executes a masking pattern-modification strategy to determine the nextmasking pattern to use in step 4210 and the process repeats steps4210-4235. For example, the strategy at step 4240 as discussed elsewhereherein may involve a search by successively dividing sets of scan chainsfor masking purposes, or may successively mask different sets of scanchains or otherwise. If no match is obtained after all this testing, andfor enough test patterns, the chip may have satisfied enough criteria offailure be recorded as failing, and the particulars will depend on thenature of the chip circuitry and the fault-tolerance measures available.

If a match is detected at step 4235 after using the maskingpattern-modification strategy of step 4240, then a step 4245 records afail log of scan chain identification numbers that signify the scanchains that were masked (decoupled by the mask from compaction). Thesescan chains have an apparent failure somewhere among them. These scanchain identifications A, B, . . . i are used by the tester in a step4250 to generate chain-specific expected data that is expected for thosescan chains A, B, . . . i (if that expected data was not alreadygenerated as a byproduct of operations in step 4215). Then a furtherstep 4260 scans out the apparently-failing scan chains A, B, . . . i andexecutes decision sub-steps 4260.A, 4260.B, . . . 4260.i to respectivelycompare the scan chain data from each scan chain thus scanned out withexpected data from step 4250 for that scan chain. In this way, step 4260observes some of the scan chains individually. Composite step 4260narrows down in one pass which such scan chains apparently have afailure depending on which comparisons fail to match. A still furtherstep 4265 has decision sub-steps 4265.A, 4265.B, . . . 4265.i thatrespectively compare flip-flop by flip-flop the scan chain data fromeach failed scan chain from step 4260 with the expected data for thatscan chain. The comparing 4265 identifies in the same one pass whichflip-flops are possibly failing in each such scan chain that has afailure detected by step 4260.

Operations proceed to a step 4270 that derives and configures revisedmask and X-tol cycle controls based on the results of steps 4245,4260.i, and 4265.i. Step 4270, for instance, generates maskingconfiguration bits based on which scanned chains are apparently failing,and scans in the test pattern and masking configuration bits to maskthose failing scan chains, at least on some cycles, and thereby defineand introduce a constrained test pattern. The X-tol cycle-by-cyclecontrols are fed in based on which flip-flops are possibly failing.Further scan-out production testing 4280 is then performed, such as bycompaction of the information from the scan chains. The testing operatesthe functional circuitry and then scans out the internal scan chains byapplying the configured masking and modulating with the X-tolcycle-by-cycle controls. Then further comparisons are performed andtesting decisions made analogous to already-described steps in theseFIGS. 10-11.

The compressed scan chain diagnostic circuitry facilitates testing ofoperations in RISC (reduced instruction set computing), CISC (complexinstruction set computing), DSP (digital signal processors),microcontrollers, PC (personal computer) main microprocessors, mathcoprocessors, VLIW (very long instruction word), SIMD (singleinstruction multiple data) and MIMD (multiple instruction multiple data)processors and coprocessors as cores or standalone integrated circuits,and in other integrated circuits and arrays. The compressed scan chaindiagnostic circuitry is useful in other types of integrated circuitssuch as ASICs (application specific integrated circuits) and gate arraysand to all circuits with structures and analogous problems to which theadvantages of the improvements described herein commend their use.

In addition to inventive structures, devices, apparatus and systems,processes are represented and described using any and all of the blockdiagrams, logic diagrams, and flow diagrams herein. Block diagram blocksare used to represent both structures as understood by those of ordinaryskill in the art as well as process steps and portions of process flows.Similarly, logic elements in the diagrams represent both electronicstructures and process steps and portions of process flows. Flow diagramsymbols herein represent process steps and portions of process flows insoftware and hardware embodiments as well as portions of structure invarious embodiments of the invention.

ASPECTS

(See Notes paragraph at end of this Aspects section.)

41A. The process claimed in claim 41 wherein the process is performed ona functional integrated circuit selected from the group consisting of 1)wireless modem circuit, 2) applications processor circuit, 3) digitalsignal processor circuit, 4) cellular telephone circuit, 5) digitalcamera circuit, 6) analog circuit, 7) CISC processor, 8) RISC processor,9) personal computer main microprocessor, 10 application specificintegrated circuit (ASIC), 11) gate array.

41B. The process claimed in claim 41 wherein the process is performed ona functional circuit of any type capable of having the scan chainsintegrated with the functional circuit.

51A. The process claimed in claim 51 further comprising changing setupand header content of the pattern set and in a test description languageto observe at least some of the internal scan chains individually.

51B. The process claimed in claim 51 further comprising downloadingcontrols to an instruction register and data register of a scan testaccess port to control the observation of the internal scan chainsindividually.

51C. The process claimed in claim 51 wherein production scan testgenerates a fail log that shows which scan channel and pattern isfailing, and the existing pattern set includes internal scan chain dataand test description code, and the process further compriseselectronically creating additional test description language code usingthe existing pattern set and fail log to control scan out of internalscan chain data.

51D. The process claimed in claim 51C wherein the electronicallycreating additional test description code includes electronicallycopying the internal scan chain data onto new test description languageso that for each failing pattern set, the process creates a new testdescription language pattern set.

51E. The process claimed in claim 51D wherein such new test descriptionlanguage pattern set brings a set of the internal scan chains out to oneor more top scan out pins of the integrated circuit, one set of scanchains equal to the number of top level scan out pins per pattern set.

51F. The process claimed in claim 51 further comprising performing theproduction scan test in a way that includes compacting scan bits fromthe internal scan chains.

51F1. The process claimed in claim 51F for use with an integratedcircuit having an output compactor wherein performing the scan test withcompacting retains the output compactor and compacts scan bits from theinternal scan chains whereby obviating scan bypass mode patterns.

T1. A process of testing a testing control circuit for a known goodfunctional integrated circuit having internal scan chains, the processcomprising:

setting up an automated test pattern generation (ATPG) tool with atleast one scan-in bits-image for that integrated circuit;

coupling the ATPG tool to the integrated circuit to scan in thatbits-image into internal scan chains therein;

also introducing different qualification/disqualification maskingpatterns for testing control of the masking selection of one or morescan chains for scan out;

scanning out the scan chains using different masking patterns for thetesting control;

comparing the data from the scanning out that used those differentmasking patterns, whereby the testing control circuit for the integratedcircuit passes a first test if non-identical sets of scan out imagesresult; and

comparing a compacted scan out image expected from at least onespecified set of scan chains for a match with a scan out image actuallycompacted for those scan chains when the masking pattern masks all butthe specified set of scan chains, whereby a match further indicates thetesting control circuit passes.

T1A. The process claimed in claim T1 for further use with anotherintegrated circuit nominally having the same functional circuitry andscan chains and the process further comprising initially compacting allthe scan chains, detecting that compaction fails to match apre-determined pattern expected for all the scan chains thus compacted;scanning out with different masking patterns until for a given maskingpattern the compaction matches a pre-determined pattern expected formasked compaction of the scan chains; and bypassing the compaction todeliver for analysis the scan outputs for that the scan chains that weremasked by the given masking pattern.

Notes about Aspects above: Aspects are paragraphs which might be offeredas claims in patent prosecution. The above dependently-written Aspectshave leading digits and internal dependency designations to indicate theclaims or aspects to which they pertain. Aspects having no internaldependency designations have leading digits and alphanumerics toindicate the position in the ordering of claims at which they might besituated if offered as claims in prosecution.

Processing circuitry comprehends digital, analog and mixed signal(digital/analog) integrated circuits, ASIC circuits, PALs, PLAs,decoders, memories, and programmable and nonprogrammable processors,microcontrollers and other circuitry. Internal and external couplingsand connections can be ohmic, capacitive, inductive, photonic, anddirect or indirect via intervening circuits or otherwise as desirable.Process diagrams herein are representative of flow diagrams foroperations of any embodiments whether of hardware, software, orfirmware, and processes of manufacture thereof. Flow diagrams and blockdiagrams are each interpretable as representing structure and/orprocess. While this invention has been described with reference toillustrative embodiments, this description is not to be construed in alimiting sense. Various modifications and combinations of theillustrative embodiments, as well as other embodiments of the inventionmay be made. The terms including, includes, having, has, with, orvariants thereof are used in the detailed description and/or the claimsto denote non-exhaustive inclusion in a manner similar to the termcomprising. The appended claims and their equivalents cover any suchembodiments, modifications, and embodiments as fall within the scope ofthe invention.

What is claimed is:
 1. Electronic scan circuitry comprising: a decompressor; a plurality of scan chains fed by the decompressor; a masking circuit fed by the plurality of scan chains, the scan chains scannable to scan them out in scan out cycles through the masking circuit; and a scannable masking qualification circuit coupled to the masking circuit and operable both to select at least one of the plurality of scan chains for disqualification and to execute the disqualification on a selected scan out cycle, the scannable masking qualification circuit including a scan-programmable shift register fed by the decompressor and accommodating at least a number n of scan programming bits and having substantially m=log₂(N/n) cells for each of a number n of sets among all N of the scan chains masked by the masking circuit.
 2. The electronic scan circuitry of claim 1 including a tester operable to configure the scannable masking qualification circuit in response to detection of unknown state content at a position in the at least one of the plurality of scan chains to disqualify the unknown state content by the masking circuit.
 3. The electronic scan circuitry of claim 1 in which the scannable masking qualification circuit is responsive to a modulating input to effectively switch between different masks depending on the state of the modulating input on the scan out cycle.
 4. The electronic scan circuitry of claim 1 including a generator circuit coupled to the masking qualification circuit to control the disqualification on a selected scan out cycle and the generator circuit having at least one programmable register responsive to a scan input.
 5. The electronic scan circuitry of claim 1 in which the masking qualification circuit includes a multiplexer having a selector input fed from an X-tol enable circuit selected from the group consisting of 1) top level X-tol enable pin, 2) core data register, 3) on-chip X-tol generator.
 6. The electronic scan circuitry of claim 1 including a programmable X-tol generator and in which the masking qualification circuit includes a multiplexer having a selector input fed from the X-tol generator.
 7. The electronic scan circuitry of claim 1 including at least one cycle identification register, a shift-cycle counter, and a comparator fed by the register and the counter, the comparator coupled to enable the masking circuit to provide masking controls to the masking qualification circuit or not cycle-by-cycle on scan-out of the scan chains.
 8. The electronic scan circuitry of claim 1 including a scan-control circuit coupled to the plurality of scan chains to scan them in and out, and the scannable masking qualification circuit is also fed by the decompressor along with the scan chains on scan-in, and the scannable masking qualification circuit is at least partially isolated from control by the scan-out circuit on scan-out.
 9. The electronic scan circuitry of claim 1 including a set of scan-in pattern bits elements to enable the masking qualification circuit to provide masking controls to the masking circuit or not, on a cycle-by-cycle basis.
 10. The electronic scan circuitry of claim 1 including a functional integrated circuit, the scan chains coupled with parts of the functional integrated circuit, the functional integrated circuit selected from the group consisting of 1) wireless modem circuit, 2) applications processor circuit, 3) digital signal processor circuit, 4) cellular telephone circuit, 5) digital camera circuit, 6) analog circuit, 7) CISC processor, 8) RISC processor, 9) personal computer main microprocessor, 10 application specific integrated circuit (ASIC), 11) gate array.
 11. The electronic scan circuitry of claim 1 including a functional integrated circuit chip integrally coupled with the scan chains, chip-level test pins, an on-chip compactor fed by the masking circuit, and an interface including an on-chip test wrapper that couples the chip-level test pins with the decompressor on-chip and the compactor. 